Author Details
Sergeev, V. A
| Issue | Section | Title | File |
| No 6 (2024) | Electromagnetic methods | TESTING SEMICONDUCTOR PRODUCTS USING LOW-FREQUENCY NOISE PARAMETERS |
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Keywords
Coherence Factor (CF)
Full Matrix Capture (FMC)
Total Focusing Method (TFM)
acoustic emission
antenna array
coercive force
corrosion
defect
eddy current testing
flaw detection
hardness
image processing
infrared thermography
modeling
non-destructive testing
nondestructive testing
standing waves
thermal testing
thermography
ultrasonic testing
ultrasound
Information
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User
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Login to verify subscription
Keywords
Coherence Factor (CF)
Full Matrix Capture (FMC)
Total Focusing Method (TFM)
acoustic emission
antenna array
coercive force
corrosion
defect
eddy current testing
flaw detection
hardness
image processing
infrared thermography
modeling
non-destructive testing
nondestructive testing
standing waves
thermal testing
thermography
ultrasonic testing
ultrasound
Information