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Mikroèlektronika
ISSN 0544-1269 (Print)
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Keywords Förster effect bipolar transistor charge qubit etching fluorine atoms fluorocarbon gases gas temperature kinetics magnetron sputtering mechanism memristor modeling molecular beam epitaxy plasma polymerization quantum dot radiation intensity reduced electric field strength resistive switching silicon specific power
Current Issue Cover Page

Vol 54, No 1 (2025)

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Keywords Förster effect bipolar transistor charge qubit etching fluorine atoms fluorocarbon gases gas temperature kinetics magnetron sputtering mechanism memristor modeling molecular beam epitaxy plasma polymerization quantum dot radiation intensity reduced electric field strength resistive switching silicon specific power
Current Issue Cover Page

Vol 54, No 1 (2025)

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A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

Z

Zabavichev, I. Yu.
Zakharov, D. M.
Zalenskaya, N. Yu.
Zarevich, A. I.
Zavitaev, E. V.
Zdoroveishchev, A. V.
Zheits, V. V.
Zikrillaev, Kh. F.
Zikrillaev, N. F.
Zolnikov, V. K.
Zubova, O. A.
Zuev, S. Yu.

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