Author Details
Воеводина, М. А.
| Issue | Section | Title | File |
| No 9 (2023) | Articles | Determining the Collimation Degree for a Coherent X-Ray Beam Using a Planar Multilens Interferometer | |
| No 2 (2025) | Articles | High Resolution Detector for X-Ray Visualization |
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Keywords
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
compact neutron source
electron microscopy
ion implantation
ion irradiation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Information
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User
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Keywords
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
compact neutron source
electron microscopy
ion implantation
ion irradiation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Information