Thin textured CdTe films on silicon and sapphire substrates: thermal vapor deposition and structural characterization

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Thin films of CdTe were grown on Si (111) and Al2O3 (0001) substrates by thermal deposition from the gas phase. The obtained films were studied using atomic force microscopy, scanning electron microscopy, and X-ray diffraction analysis. It was found that on Al2O3 (0001) substrates, thin films of both wurtzite and sphalerite modifications of CdTe can be obtained. On Si substrates, thin films of the sphalerite modification of CdTe can be obtained. It is shown that the elemental composition of thin films is close to stoichiometry, and in the case of thin films grown on Al2O3 (0001), the deviation did not exceed 1 at. %.

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作者简介

I. Koshelev

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC “Kurchatov Institute”

编辑信件的主要联系方式.
Email: iliakoscheleff@yandex.ru
俄罗斯联邦, Moscow

I. Volchkov

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC “Kurchatov Institute”

Email: iliakoscheleff@yandex.ru
俄罗斯联邦, Moscow

P. Podkur

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC “Kurchatov Institute”

Email: iliakoscheleff@yandex.ru
俄罗斯联邦, Moscow

D. Khairetdinova

MISIS National University of Science and Technology

Email: iliakoscheleff@yandex.ru
俄罗斯联邦, Moscow

I. Doludenko

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC “Kurchatov Institute”

Email: iliakoscheleff@yandex.ru
俄罗斯联邦, Moscow

V. Kanevsky

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC “Kurchatov Institute”

Email: iliakoscheleff@yandex.ru
俄罗斯联邦, Moscow

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2. Fig. 1. The location of the substrate relative to the CdTe spraying area in the thermal spraying unit (a) and the dependence of the deviation of the Cd content (at. %) on stoichiometry (b)

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3. Fig. 2. X–ray diffractograms of CdTe thin films grown on Si (a) and Al2O3 (b) substrates. The inset shows an enlarged diffractogram area for a thin film grown on an Al2O3 substrate in the angle range 42°-52°. The curve numbers correspond to the area numbers in Fig. 1a

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4. Fig. 3. AFM images of a thin CdTe film grown on an Al2O3 (0001) substrate: a, b, c – regions 1, 2, 3, respectively. The inset shows an enlarged view of large crystallites, presumably of the hexagonal phase of wurtzite

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5. Fig. 4. AFM images of a thin CdTe film grown on a Si (111) substrate: a, b, c – regions 1, 2, 3, respectively. The inset shows an enlarged view of area 1

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